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Table 2.

Count rate degradation induced by neutron fluence for diodes A (a) and C (b).

a

Reactor Day Fluence range Mean Mean count Count rate drift Count rate
power (W) (cm−2) temperature (°C) rate (s−1) (s−1) relative drift (%)
100 1 7.4 × 1013–7.6 × 1013 23.8 5920.7 −1502.7 −22.2%
200 1 8.1 × 1013–9.1 × 1013 23.8 6551.5 −2101.1 −28.0%
1000 1 1.1 × 1014–1.7 × 1014 24.0 24766.3 −3626.9 −13.8%
2000 1 2.2 × 1014–3.3 × 1014 24.6 37314.2 −5665.0 −14.0%
5000 1 4.8 × 1014–7.1 × 1014 25.6 62719.2 −12015.5 −17.6%
10 000 1 8.9 × 1014–1.4 × 1015 27.1 75803.5 −16362.8 −19.5%
20000 1 1.7 × 1015–2.2 × 1015 29.5 84044.2 −15072.8 −16.4%
20000 2 3.2 × 1015–4.2 × 1015 26.0 68485.8 −12909.7 −17.2%
50000 2 5.3 × 1015–8.5 × 1015 35.8 77530.5 −35692.6 −36.9%
100000 2 1.1 × 1016–2.4 × 1016 53.1 28536.6 −53611.7 −83.6%
150000 2 2.8 × 1016–3.6 × 1016 64.2 7085.6 −4240.6 −46.5%
200000 2 4.2 × 1016–5.5 × 1016 77.5 2251.3 −2513.4 −68.1%
250000 2 6.6 × 1016–1.1 × 1017 92.8 869.3 −2526.9 −99.9%

b

Reactor Day Fluence range Mean Mean count Count rate drift Count rate
power (W) (cm−2) temperature (°C) rate (s−1) (s−1) relative drift (%)

100 1 2.5 × 1013–3.8 × 1013 23.9 3536.1 −4197.4 −67.4%
200 1 4.3 × 1013–5.3 × 1013 23.9 3400.6 −3133.7 −73.0%
1000 1 8.0 × 1013–1.4 × 1014 24.1 20379.6 −3592.5 −16.1%
2000 1 1.9 × 1014–3.3 × 1014 24.7 31096.7 −7759.4 −22.0%
5000 1 4.8 × 1014–7.0 × 1014 25.7 55936.6 −10528.0 −17.2%
10000 1 9.7 × 1014–1.4 × 1015 27.3 69180.6 −19196.6 −24.5%
20000 1 1.8 × 1015–2.3 × 1015 29.7 75812.3 −17009.5 −20.2%
20000 2 3.2 × 1015–4.3 × 1015 26.3 48252.5 −13395.8 −24.0%
50000 2 5.9 × 1015–8.6 × 1015 36.2 43966.1 −27516.0 −46.2%
100000 2 1.2 × 1016–2.5 × 1016 53.7 16138.2 −23970.6 −75.6%
150000 2 3.0 × 1016–3.7 × 1016 65.0 5337.8 −3413.3 −47.1%
200000 2 4.4 × 1016–5.8 × 1016 78.7 1566.5 −1834.9 −71.7%
250000 2 7.6 × 1016–1.2 × 1017 94.2 62.8 −154.4 −91.1%

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