| Issue |
EPJ Nuclear Sci. Technol.
Volume 3, 2017
|
|
|---|---|---|
| Article Number | 24 | |
| Number of page(s) | 8 | |
| DOI | https://doi.org/10.1051/epjn/2017016 | |
| Published online | 28 July 2017 | |
https://doi.org/10.1051/epjn/2017016
Regular Article
RadFET dose response in the CHARM mixed-field: FLUKA MC simulations
CERN, European Organization for Nuclear Research, Geneva, Switzerland
⁎ e-mail: matteo.marzo@cern.ch
Received:
18
January
2017
Received in final form:
16
May
2017
Accepted:
19
June
2017
Published online: 28 July 2017
This paper focuses on Monte Carlo simulations aimed at calculating the dose response of the RadFET dosimeter, when exposed to the complex CHARM mixed-fields, at CERN. We study how the dose deposited in the gate oxide (SiO2) of the RadFET is affected by the energy threshold variation in the Monte Carlo simulations as well as the materials and sizes of scoring volumes. Also the characteristics of the input spectra will be taken into account and their impact on the final simulated dose will be studied. Dose variation as a function of the position of the RadFET in the test facility will be then examined and comparisons with experimental results will be shown. The contribution to the total dose due to all particles of the mixed-field, under different target-shielding configurations, is finally presented, aiming at a complete characterization of the RadFETs dose response in the CHARM mixed-fields.
© M. Marzo et al., published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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