SEM/EDS observation of synthesized FeCrAl specimens after etching at 2000 times magnification: (a) without Si, (b) with 0.25 wt.% Si, (c) 0.50 wt.% Si, (d) 1.00 wt.% Si, (e) 2.00 wt.% Si, (f) 4.00 wt.% Si, and (g) 8.00 wt.% Si. Well-defined grains are discernible from all specimens. EDS analysis reveals the relatively uniform distribution of all elements. Notably, in the specimen devoid of Si, surface is very coarse. As the concentration of Si increases, the coarseness of the surface decrease accordingly.