Open Access
Table 7
Test facilities.
Item | Description |
---|---|
Test date | April 2012 |
Device under test | 180A 400 V 3PH + N Battery UPS-I |
Software revision | R1E2 |
Measurement method | Multi Channel Hioki 8861 Memory HiCORDER |
Sag generator | IGBT instantaneous sag generator |
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