Templates of expected measurement uncertainties for (n, xn) cross sections Jeffrey R. Vanhoy, Robert C. Haight, Sally F. Hicks, Matthew Devlin, Denise Neudecker, Michal Herman, Arjan Koning, Keegan J. Kelly and Ian Thompson EPJ Nuclear Sci. Technol., 9 (2023) 31 Published online: 09 November 2023 DOI: 10.1051/epjn/2023019