EPJ N

Probabilistic risk bounds for the characterization of radiological contamination

Géraud Blatman, Thibault Delage, Bertrand Iooss and Nadia Pérot

EPJ Nuclear Sci. Technol., 3 (2017) 23

Published online: 10 July 2017

DOI: 10.1051/epjn/2017017

Géraud Blatman

Thibault Delage

Bertrand Iooss

Nadia Pérot

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