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Templates of expected measurement uncertainties for (n, xn) cross sections

Jeffrey R. Vanhoy, Robert C. Haight, Sally F. Hicks, Matthew Devlin, Denise Neudecker, Michal Herman, Arjan Koning, Keegan J. Kelly and Ian Thompson

EPJ Nuclear Sci. Technol., 9 (2023) 31

DOI: https://doi.org/10.1051/epjn/2023019

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