Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

This article has been cited by the following article(s):

L. Obermueller, C. Cazzaniga, S. Kulmiya and C. D. Frost
1 (2018)
DOI: 10.1109/RADECS45761.2018.9328731
See this article

Single Event Upsets characterization of 65 nm CMOS 6T and 8T SRAM cells for ground level environment

Daniel Malagón, Gabriel Torrens, Jaume Segura and Sebastià A. Bota
Microelectronics Reliability 110 113696 (2020)
DOI: 10.1016/j.microrel.2020.113696
See this article